Measurement of the Electro-Optic Coefficients In Electro-Optic Crystals using Compensated Sénarmont System
Basic Education College Magazine For Educational and Humanities Sciences
2012, Volume , Issue Special, Pages 445-449
2012, Volume , Issue Special, Pages 445-449
Abstract
Electro-optic crystal have received considerable attention for many application due to their large electro-optic (EO) and nonlinear optical coefficients [1,2]. Several techniques have been designed for the characterization of the electro-optic properties of bulk samples [3,4]. The disadvantage of these systems are that it require a high ac modulated voltage (up to 300 Vp-p) and the material be made with a large EO coefficients.
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