Structural and photoluminescence properties of CdO doped TiO2 thin films prepared by pulsed laser deposition


TiO2 thin films have been deposited at different concentration of CdO of (x= 0.0, 0.05, 0.1, 0.15 and 0.2) Wt. % onto glass substrates by pulsed laser deposition technique (PLD) using Nd-YAG laser with λ=1064nm, energy=800mJ and number of shots=500. The thickness of the film was 200nm. The films were annealed to different annealing (423 and 523) k. The effect of annealing temperatures and concentration of CdO on the structural and photoluminescence (PL) properties were investigated. X-ray diffraction (XRD) results reveals that the deposited TiO2(1-x)CdOx thin films were polycrystalline with tetragonal structure and many peaks were appeared at (110), (101), (111) and (211) planes with preferred orientation along 2Ɵ around 27.30. The results of photoluminescence (PL) emission show that there are two peaks positioned are around 320 nm and 400 nm for predominated peak and 620 nm and 680 nm for the small peaks.