Modification of morphological and optical properties of ZnOthin film

Abstract

Zink oxide thin films were prepared using different wet-processing techniques to study the morphological and optoelectronicproperties. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) have been utilized to study the effect oftechnique and preparation procedure on the morphology of the films. The spin coated ZnO layers have exhibited ripple-shapedmorphological features. Using the growth process with ZnCl2and Al(NO3)3doping at different time has shown a change in sur-face morphology. UVeVisible absorption spectroscopy was used to understand the absorption behaviour and so to calculate theenergy gap (Eg) for the films produced. It has been revealed thatEgof the ZnO thin film increases with the increasing of the numberof layers spun onto the substrate. ZnCl2doping has no quite big change inEgvalues, however, Al(NO3)3has resulted in a higherEgvalue.