Preperation and study optical trasnpraency of spray deposted ZnS films with different annealing temperatures

Abstract

The article reports the preparation of ZnS films prepared by chemical method, The band gap of ZnS films is calculated theirs value are nearly of (4 eV) for all samples The experimental diffraction angle θ and d- spacing values are in a well agreement with the standard ASTM data at all annealing temperature used (450,500,550,600 oC) of ZnS thin films. The grain size (D) increases with increasing temperature. The increase in the temperature of annealing leads to lower peaks of x- ray diffraction pattern for structural analysis. . The thickness of the prepared film is around (283nm).