TY - JOUR ID - TI - Effect of Thickness on Optical and Electrical Properties of ZnO Prepared by CBD AU - S.M.H. Aljawad AU - A.F.S. Alshareefi AU - A.K. Judran PY - 2011 VL - 7 IS - 1 SP - 11 EP - 16 JO - Iraqi Journal of Applied Physics المجلة العراقية للفيزياء التطبيقية SN - 18132065 23091673 AB - ZnO Thin films were deposited by chemical bath deposition. Structure, optical, and electrical properties of these films were analyzed in order to investigate their dependence on thickness of films. High quality ZnO films with a low resistivity of 1.3 cm and transparency above 80% were able to be formed for thickness 95.8nm. X-ray diffraction and spectrophotometer are used to investigate the properties of ZnO films.

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