The Effect of Substrate Temperature on the Structural Properties and Electronic transitions of Copper Oxide thin Films

Abstract

In this Study, Copper oxide films were deposited on the glass substrates heated at different temperatures of (623,673,723,773)K by Spray Pyrolysis technique. The effect of substrate temperature on the structural properties and electronic transitions of the films was estimated. The XRD results showed that all the prepared films were polycrystalline, monoclinic crystal structure with a preferred orientation along (1 ̅11). The average crystallite size was increased from (12nm) to (19nm) with increasing of substrate temperature, also atomic force microscope (AFM) images showed the grain size increased from (74.5nm) to (99) as well as the average surface roughness and root mean square value (RMS) of the films increased with increasing substrate temperature expect values at atemperature of (723K) from these results we conclude that these films have some nanostructure for transition was decrease from (2.11eV) to (2.01eV) by increasing substrate prepared films. and The optical energy gap for allowed direct electronic temperature. .