Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction

Abstract

A polycrystalline CdS Films have been evaporated by thermal evaporation techniquewith different thicknesses under vacuum of about 8 × 10-5 mbar and substrate temperature ofabout 373 K on glass substrates, the films annealed at 573K for different duration times (60,120 and180 min.). The structural properties of the films have been studied by X- raydiffraction technique, some structural parameters like miller indices, dstnd, dexp, I/Io stnd and I/Iohave been calculated and compared for the CdS alloy and films.