Effect of Deposition Temperature on Optical and Crystallographic Properties of CsI Thick Films Deposited using Spray Pyrolysis

Abstract

A deposited layer of CsI has been prepared at different substratetemperatures using spray pyrolysis technique. The X Ray diffraction of CsIfilms reveals special pattern peaks (110), (200), (211), (220), (310) and (321).From transmission spectra we calculated the energy gap of CsI films whichincrease with increasing deposition temperature for direct transition isestimated.