Optic Properties of Tellurium Thin Film Prepared by Chemical Spray Pyrolysis Method

Abstract

In this work, Tellurium thin film has been prepared by chemical spray pyrolysis deposition on glass substrates. X-ray diffraction spectrum have shown that the prepared film has polycrystalline structure and peaks for Tellurium hexagonal structure. Also, the microstructure analysis using optical microscope illustrated the contrast of topography of this thin film which showed highest homogeneity and regularity. The obtained results of this work are in good agreement with the standard X-ray published data [1]. Optical properties involved measurement of transmittance, absorptance, and calculation of extinction coefficient in addition to calculation of the absorption coefficient and energy band gap. Optical measurements results showed that optical band gap of prepared thin film is ( 0.5) ev with absorption coefficient of 104 cm-1.