Morphological study of graphite surface and structure by scanning tunneling microscope

Abstract

In this research ,the relation between the images of scanning tunneling microscopy and all of the current and voltage tip for graphite surface has been studied .The results show that the best value of voltage of the tip that led to better relation between the tip and graphite surface is (100 mV) while, the best value of the current between graphite surface and the tip is ( 1nA ) .The increasing of the current value leads to appear direct contacts between the tip and the sample surface .For this reason, the ability of the analysis depends on the number of points or atoms (number of data) per unit area that arrives the sensor in the device ,where by increasing it , the quality of the image is increased .The images of STM show the arrangement of hexagonal atoms and different resolution .